Apertureless Magneto-Optical Scanning Thnneling Microscope with High Resolution

• van Kempen H.

  Reserch Institure for Materials, University of Nijmegen

• Schad R.

  Reserch Institure for Materials, University of Nijmegen

• Jordan S.M.

  Reserch Institure for Materials, University of Nijmegen

• Stoelinga M.J.P.

  Reserch Institure for Materials, University of Nijmegen

• Prins M.W.J.

  Philips Research Laboratories

• Groeneveld R.H.M.

  Reserch Institure for Materials, University of Nijmegen

• van Kesteren H.W.

  Reserch Institure for Materials, University of Nijmegen

収録刊行物

• 日本応用磁気学会誌

  日本応用磁気学会誌 23 (S_1_MORIS_99), S1_211-212, 1999

  公益社団法人 日本磁気学会

キーワード

• Electrical and Electronic Engineering
• Condensed Matter Physics
• Instrumentation
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1390282680069935360
• NII論文ID: 130004478679
• DOI: 10.3379/jmsjmag.23.s1_211
• ISSN: 18804004
• ISSN: 02850192
• 本文言語コード: en
• データソース種別:
  • JaLC
  • Crossref
  • CiNii Articles