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- Okada Yoshitaka
- Institute of Materials Science, University of Tsukuba, 1–1–1 Tennodai, Tsukuba, Ibaraki 305, Japan
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- Sugaya Takeyoshi
- Institute of Materials Science, University of Tsukuba, 1–1–1 Tennodai, Tsukuba, Ibaraki 305, Japan
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- Ohta Shigeru
- Institute of Materials Science, University of Tsukuba, 1–1–1 Tennodai, Tsukuba, Ibaraki 305, Japan
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- Fujita Tomoya
- Institute of Materials Science, University of Tsukuba, 1–1–1 Tennodai, Tsukuba, Ibaraki 305, Japan
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- Kawabe Mitsuo
- Institute of Materials Science, University of Tsukuba, 1–1–1 Tennodai, Tsukuba, Ibaraki 305, Japan
抄録
A continual irradiation of atomic H during the growth of GaAs in molecular beam epitaxy (MBE) has been shown to be a viable method to obtain sharp heterointerfaces and high-quality epitaxial layers. We provide some fundamentally important observations related to atomic scale mechanisms and interactions, and the growth models for atomic H-assisted homoepitaxial GaAs MBE are proposed. Atomic H has been shown to be an efficient surfactant reducing the surface and total energy of GaAs(100) that acts to promote layer-by-layer and step-flow growth mode. However, the actual growth kinetics is different depending on the growth temperature, which affects the energetic stability of atomic H adsorption on GaAs(100). Furthermore, the continual removal of surface contaminants and also the excess arsenic during the growth are thought to be another important attribute played by atomic H.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 34 (1), 238-244, 1995
The Japan Society of Applied Physics
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キーワード
詳細情報 詳細情報について
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- CRID
- 1390001206246667520
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- NII論文ID
- 210000037289
- 130004520694
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- ISSN
- 13474065
- 00214922
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可