Characteristics of Material for Photoresist Spin Coating: Property for Reduction of Photoresist Consumption.

  • Sanada Masakazu
    Spinner Fundamental Technology R&D Group, Research and Development Department, Electronics Equipment Division, Dainippon Screen Mfg. Co. Ltd., 322, Furukawa–cho, Hazukashi, Fushimi–ku, Kyoto 612–8486, Japan
  • Nakano Kayoko
    Spinner Fundamental Technology R&D Group, Research and Development Department, Electronics Equipment Division, Dainippon Screen Mfg. Co. Ltd., 322, Furukawa–cho, Hazukashi, Fushimi–ku, Kyoto 612–8486, Japan
  • Matsunaga Minobu
    Spinner Fundamental Technology R&D Group, Research and Development Department, Electronics Equipment Division, Dainippon Screen Mfg. Co. Ltd., 322, Furukawa–cho, Hazukashi, Fushimi–ku, Kyoto 612–8486, Japan

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タイトル別名
  • Characteristics of Material for Photoresist Spin Coating

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The spin coating property for the reduction of the photoresist consumption was investigated experimentally using photoresist samples systematically. Dry film thickness D is affected by spin velocity ω : D=kω -1/2, where k is a constant. The photoresist samples can be characterized by a constant k irrespective of their composition. The same k photoresist results in the same consumption when the prespin velocity is optimized for reducing the consumption. The consumption is reduced as k becomes smaller. In the case where the prespin velocity is fixed, the consumption becomes smaller for the sample for which the solvent viscosity is small and the solvent evaporation rate is large.

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