A Process and Temperature Tolerant Oscillator-Based True Random Number Generator

• AMAKI Takehiko

  Department of Information Systems Engineering, Osaka University JST, CREST

• HASHIMOTO Masanori

  Department of Information Systems Engineering, Osaka University JST, CREST

• ONOYE Takao

  Department of Information Systems Engineering, Osaka University JST, CREST

抄録

This paper presents an oscillator-based true random number generator (TRNG) that dynamically unbiases 0/1 probability. The proposed TRNG automatically adjusts the duty cycle of a fast oscillator to 50%, and generates unbiased random numbers tolerating process variation and dynamic temperature fluctuation. A prototype chip of the proposed TRNG was fabricated with a 65nm CMOS process. Measurement results show that the developed duty cycle monitor obtained the probability of ‘1’ 4,100 times faster than the conventional output bit observation, or estimated the probability with 70 times higher accuracy. The proposed TRNG adjusted the probability of ‘1’ to within 50±0.07% in five chips in the temperature range of 0°C to 75°C. Consequently, the proposed TRNG passed the NIST and DIEHARD tests at 7.5Mbps with 6,670µm² area.

収録刊行物

• IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

  IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences E97.A (12), 2393-2399, 2014

  一般社団法人 電子情報通信学会

キーワード

• true random number generator
• hardware random number generator
• oscillator-based random number generator

詳細情報

• CRID: 1390282681287508608
• NII論文ID: 130004706401
• DOI: 10.1587/transfun.e97.a.2393
• ISSN: 17451337
• ISSN: 09168508
• Web Site: https://www.jstage.jst.go.jp/article/transfun/E97.A/12/E97.A_2393/_pdf
• 本文言語コード: en
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