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- Tanahara Shohei
- Department of Engineering Science, University of Electro-Communications
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- Inoue Daisuke
- Department of Engineering Science, University of Electro-Communications
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- Machida Shingo
- Department of Engineering Science, University of Electro-Communications
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- Ikada Yuka
- Department of Engineering Science, University of Electro-Communications
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- Taniguchi Junko
- Department of Engineering Science, University of Electro-Communications
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- Suzuki Masaru
- Department of Engineering Science, University of Electro-Communications
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- Ishikawa Makoto
- Department of Physics, Aichi University of Education
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- Miura Kouji
- Department of Physics, Aichi University of Education
抄録
We carried out the surface mapping of the dynamic friction and the effective elastic stiffness of contact by using a quartz crystal resonator and an AFM cantilever, associated with the topographic image. The tip was scanned across the Au substrate on the resonator in the constant-height mode. A typical grain structure of the Au substrate in the dynamic friction and the effective stiffness images was observed, simultaneously with the topographical image. This technique enables us to observe the surface properties related to contact in the nanometer scale. [DOI: 10.1380/ejssnt.2015.164]
収録刊行物
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- e-Journal of Surface Science and Nanotechnology
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e-Journal of Surface Science and Nanotechnology 13 (0), 164-166, 2015
公益社団法人 日本表面真空学会
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キーワード
詳細情報 詳細情報について
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- CRID
- 1390282680162335104
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- NII論文ID
- 130005063563
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- ISSN
- 13480391
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
- KAKEN
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- 抄録ライセンスフラグ
- 使用不可