単結晶X線回折と有機化合物の絶対配置決定

• 松本 有正

  東京理科大学理学部応用化学科

書誌事項

タイトル別名

• Absolute Configuration Analysis of Organic Compounds by Single Crystal X-ray Diffraction
• ラウンジ 単結晶X線回折と有機化合物の絶対配置決定
• ラウンジ タンケッショウ Xセン カイセツ ト ユウキ カゴウブツ ノ ゼッタイ ハイチ ケッテイ

抄録

Thanks to the development of automation systems and programs for single crystal X-ray diffraction analysis, X-ray structure analysis have become a familiar technic for organic chemists to obtain structural information. However, determination of the absolute configuration of organic compounds only including light-atom (C, H, N, O) by X-ray diffraction have been a difficult topic due to the weak resonant scattering from light atoms. The main purpose of this review is to introduce recent developments of absolute structure determination method by X-ray structure analysis. New algorisms, such as Hooft parameter and Parsons parameter, make it possible to determine the absolute configuration of organic compound by typical X-ray diffractometer without any special equipment.

収録刊行物

• 有機合成化学協会誌

  有機合成化学協会誌 73 (7), 755-761, 2015

  公益社団法人 有機合成化学協会

キーワード

• single crystal X-ray structure analysis
• chirality
• chiral crystal
• absolute structure
• absolute configuration
• Flack Parameter
• Hooft parameter
• Parsons parameter

詳細情報

• CRID: 1390001205341548672
• NII論文ID: 130005093750
• NII書誌ID: AN0024521X
• DOI: 10.5059/yukigoseikyokaishi.73.755
• ISSN: 18836526
• ISSN: 00379980
• NDL書誌ID: 026608007
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I026608007
• Web Site: https://www.jstage.jst.go.jp/article/yukigoseikyokaishi/73/7/73_755/_pdf
• 本文言語コード: ja
• データソース種別:
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  • NDL
  • Crossref
  • CiNii Articles
  • KAKEN
• 抄録ライセンスフラグ: 使用不可