Relation between n-Value and Critical Current in Filamentary and Coated Superconducting Tapes with Tensile Stress-Induced Cracks

• Ochiai Shojiro

  Elements Strategy Initiative for Structural Materials, Kyoto University

• Okuda Hiroshi

  Department of Materials Science and Engineering, Kyoto University

• Fujimoto Masahiro

  Department of Materials Science and Engineering, Kyoto University

• Osamura Kozo

  Research Institute for Applied Sciences

書誌事項

タイトル別名

• Relation between <i>n</i>-Value and Critical Current in Filamentary and Coated Superconducting Tapes with Tensile Stress-Induced Cracks

抄録

We have determined experimentally that the n-value of tension-damaged bismuth strontium calcium copper oxide (BSCCO, Bi2223) filamentary superconducting tape decreases very sharply with decreasing critical current, compared with bending-damaged tape. In this work, the sharp decrease in the n-value associated with decreasing critical current under applied tensile stress/strain was studied with a current shunting model that assumes cracks in filamentary and coated superconductors. In a filamentary conductor containing collective filament cracks, defined as cracks composed of successively cracked filaments in a transverse cross-section, the decrease in the cross-sectional area of the superconducting current transportable-filaments reduces the critical current, and the shunting current at the crack reduces the n-value. In addition, the decrease in the electrical resistance in the current shunting circuit increases the critical current slightly and decreases the n-value sharply. The experimentally measured relationship between the n-value and the critical current for two BSCCO samples from different manufacturers was described by the upper and lower bounds calculated with the current shunting circuit resistance as a variable. The experimentally measured relationship between the n-value and the critical current for two different coated conductors were described in a similar manner.

収録刊行物

• MATERIALS TRANSACTIONS

  MATERIALS TRANSACTIONS 56 (9), 1558-1564, 2015

  公益社団法人 日本金属学会

キーワード

• superconducting tape
• crack
• critical current
• <i>n</i>-value
• modeling analysis
• shunting current

詳細情報

• CRID: 1390001204253075584
• NII論文ID: 130005094776
• NII書誌ID: AA1151294X
• DOI: 10.2320/matertrans.maw201501
• ISSN: 13475320
• ISSN: 13459678
• HANDLE: 2433/250427
• NDL書誌ID: 026709797
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I026709797
• Web Site: https://www.jstage.jst.go.jp/article/matertrans/56/9/56_MAW201501/_pdf
• 本文言語コード: en
• データソース種別:
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