Defect depth estimation using magneto optical imaging with magnetophotonic crystal

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  • Hashimoto R.
    Department of Electrical and Electronic Information Engineering, Toyohashi Univ. of Tech.
  • Yonezawa T.
    Department of Electrical and Electronic Information Engineering, Toyohashi Univ. of Tech.
  • Takagi H.
    Department of Electrical and Electronic Information Engineering, Toyohashi Univ. of Tech.
  • Goto T.
    Department of Electrical and Electronic Information Engineering, Toyohashi Univ. of Tech.
  • Endo H.
    Hitachi Research Laboratory, Hitachi Ltd.
  • Nishimizu A.
    Hitachi Research Laboratory, Hitachi Ltd.
  • Inoue M.
    Department of Electrical and Electronic Information Engineering, Toyohashi Univ. of Tech.

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Non-destructive inspection (NDI) is used to detect defects for safety. The magneto optical (MO) imaging is an attractive method for NDI. The MO imaging can visualize defects as a light intensity of image, which depends on the polarization rotation angle of the MO film. The polarization rotation angle depends on the stray filed in the vertical direction. To accurately detect the stray field, it is necessary to enhance the Faraday rotation angle. Therefore, we focused on magnetophotonic crystal (MPC), which can enhance the MO effect with thin film, comprising the polycrystalline bismuth substituted yttrium iron garnet. We estimated the defect depth with the MPC located on the iron with a defect, which depth was varied from 1 mm to 10 mm. The results showed good agreement with the defect depth measured by the dial gauge.

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