Easily & Quickly New Screening Analytical Methods in Surface Analysis

• Hayashi Morinobu

  HORIBA,Ltd.

• Miura Tetsusaburo

  HORIBA,Ltd.

• Fujimoto Akira

  HORIBA,Ltd.

• Nakata Yasushi

  HORIBA,Ltd.

Bibliographic Information

Other Title

• 簡単迅速　表面分析における新たなスクリーニング手法
• カンタン ジンソク ヒョウメン ブンセキ ニ オケル アラタ ナ スクリーニング シュホウ
• Easily & Quickly New Screening Analytical Methods in Surface Analysis

Abstract

To improve sample analysis efficiency and equipment's cost performance for scientific instruments users, highthroughput non-destructive instruments which working in atmosphere condition without need for sample preparation, are highly recommended. In this work, we will introduce some instruments, suitable for the quick “Screening test”, and focusing on the latest surface analysis instrument, with some applications.

Journal

• Zairyo-to-Kankyo

  Zairyo-to-Kankyo 64 (7), 289-296, 2015

  Japan Society of Corrosion Engineering

Keywords

• Screening test
• surface analysis
• XRF microscope
• Raman microscope
• confocal microscope
• AFM
• Elemental depth profile
• rf-GD-OES
• rf-GD-TOFMS

Details

• CRID: 1390001206258278144
• NII Article ID: 130005120135
• NII Book ID: AN10235427
• DOI: 10.3323/jcorr.64.289
• ISSN: 18819664
• ISSN: 09170480
• NDL BIB ID: 026620509
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I026620509
• Web Site: https://www.jstage.jst.go.jp/article/jcorr/64/7/64_289/_pdf
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed