On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption
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- ZHANG Yucong
- Kyushu Institute of Technology
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- HOLST Stefan
- Kyushu Institute of Technology
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- WEN Xiaoqing
- Kyushu Institute of Technology
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- MIYASE Kohei
- Kyushu Institute of Technology
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- KAJIHARA Seiji
- Kyushu Institute of Technology
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- QIAN Jun
- Advanced Micro Devices, Inc.
抄録
<p>Loading test vectors and unloading test responses in shift mode during scan testing cause many scan flip-flops to switch simultaneously. The resulting shift switching activity around scan flip-flops can cause excessive local IR-drop that can change the states of some scan flip-flops, leading to test data corruption. A common approach solving this problem is partial-shift, in which multiple scan chains are formed and only one group of the scan chains is shifted at a time. However, previous methods based on this approach use random grouping, which may reduce global shift switching activity, but may not be optimized to reduce local shift switching activity, resulting in remaining high risk of test data corruption even when partial-shift is applied. This paper proposes novel algorithms (one optimal and one heuristic) to group scan chains, focusing on reducing local shift switching activity around scan flip-flops, thus reducing the risk of test data corruption. Experimental results on all large ITC'99 benchmark circuits demonstrate the effectiveness of the proposed optimal and heuristic algorithms as well as the scalability of the heuristic algorithm.</p>
収録刊行物
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- IEICE Transactions on Information and Systems
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IEICE Transactions on Information and Systems E104.D (6), 816-827, 2021-06-01
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詳細情報
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- CRID
- 1390569690549906176
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- NII論文ID
- 130008046642
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- ISSN
- 17451361
- 09168532
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可