%A Hu, Cheng-Yu
%A Nokubo, Hiroyuki
%A Okada, Masanari
%A Ao, Jin-Ping
%A Ohno, Yasuo
%T Metal-Insulator-Semiconductor Diode Characterization on n-GaN by Capacitance-Voltage Measurement at 150 degrees C
%J JAPANESE JOURNAL OF APPLIED PHYSICS
%0 Journal Article
%@ 0021-4922
%I Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics
%D 2010
%8 2010-04-25
%V 49
%N 4
%P 04DF11-04DF11-3
%U http://ci.nii.ac.jp/naid/150000053731/
%R 10.1143/JJAP.49.04DF11