TY  - JOUR
AU  - Cheng-Yu Hu,
AU  - Hiroyuki Nokubo,
AU  - Masanari Okada,
AU  - Jin-Ping Ao,
AU  - Yasuo Ohno,
TI  - Metal-Insulator-Semiconductor Diode Characterization on n-GaN by Capacitance-Voltage Measurement at 150 degrees C
T2  - JAPANESE JOURNAL OF APPLIED PHYSICS
SN  - 0021-4922
PY  - 2010
DA  - 2010/04/25
VL  - 49
IS  - 4
SP  - 04DF11-04DF11-3
UR  - http://ci.nii.ac.jp/naid/150000053731/
DO  - 10.1143/JJAP.49.04DF11
ER  -