Scanning tunneling microscopy/spectroscopy on MoS₂ embedded nanowire formed in CVD-grown Mo₁₋ <i> _x </i>W<i> _x </i>S₂ alloy

• Hiroyuki Mogi

• Yu Kobayashi

• Atsushi Taninaka

• Ryuji Sakurada

• Takahiro Takeuchi

• Shoji Yoshida

• Osamu Takeuchi

• Yasumitsu Miyata

• Hidemi Shigekawa

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 56 (8S1), 08LB06-, 2017-07-19

  IOP Publishing

キーワード

• General Physics and Astronomy
• Physics and Astronomy (miscellaneous)
• General Engineering

詳細情報

• CRID: 1360847874821376256
• NII論文ID: 210000148181
• DOI: 10.7567/jjap.56.08lb06
• ISSN: 13474065
• ISSN: 00214922
• ISSN: http://id.crossref.org/issn/13474065
• Web Site: http://stacks.iop.org/1347-4065/56/i=8S1/a=08LB06/pdf
• Web Site: http://stacks.iop.org/1347-4065/56/i=8S1/a=08LB06?key=crossref.a1825f3663d41e017886383cf70c971c
• データソース種別:
  • Crossref
  • CiNii Articles
  • KAKEN