Analytical method for the measurement of the electrostatic force and the contact potential difference excluding the effect of the Casimir force with a conventional atomic force microscope

• Naoki Yoshida

• Kazuhisa Sueoka

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 58 (SI), SIIA08-, 2019-06-25

  IOP Publishing

キーワード

• General Physics and Astronomy
• Physics and Astronomy (miscellaneous)
• General Engineering

詳細情報

• CRID: 1360847874812884096
• NII論文ID: 210000156521
• DOI: 10.7567/1347-4065/ab1b6a
• ISSN: 13474065
• ISSN: 00214922
• Web Site: https://iopscience.iop.org/article/10.7567/1347-4065/ab1b6a/pdf
• Web Site: https://iopscience.iop.org/article/10.7567/1347-4065/ab1b6a
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