Electronic properties of nanometer-size metal-semiconductor point contacts studied by STM

• Y. Hasegawa

• I.-W. Lyo

• Ph. Avouris

収録刊行物

• Applied Surface Science

  Applied Surface Science 76-77 347-352, 1994-03

  Elsevier BV

キーワード

• Surfaces, Coatings and Films
• Condensed Matter Physics
• Surfaces and Interfaces
• General Physics and Astronomy
• General Chemistry

詳細情報

• CRID: 1361981469759853056
• NII論文ID: 30002967144
• DOI: 10.1016/0169-4332(94)90366-2
• ISSN: 01694332
• Web Site: https://api.elsevier.com/content/article/PII:0169433294903662?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:0169433294903662?httpAccept=text/plain
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  • CiNii Articles