Application of the shear cell technique to diffusivity measurements in melts of semiconducting compounds: Ga–Sb
収録刊行物
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- Journal of Crystal Growth
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Journal of Crystal Growth 186 (4), 511-519, 1998-03
Elsevier BV
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詳細情報 詳細情報について
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- CRID
- 1363107371237493504
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- NII論文ID
- 30004613646
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- ISSN
- 00220248
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- データソース種別
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- Crossref
- CiNii Articles