Local structures around Er atoms doped in InP revealed by fluorescence EXAFS

• H Ofuchi

• D Kawamura

• N Matsubara

• M Tabuchi

• Y Fujiwara

• Y Takeda

収録刊行物

• Microelectronic Engineering

  Microelectronic Engineering 43-44 745-751, 1998-08

  Elsevier BV

キーワード

• Electrical and Electronic Engineering
• Surfaces, Coatings and Films
• Condensed Matter Physics
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1360292621296782336
• NII論文ID: 30005463092
• DOI: 10.1016/s0167-9317(98)00253-6
• ISSN: 01679317
• Web Site: https://api.elsevier.com/content/article/PII:S0167931798002536?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:S0167931798002536?httpAccept=text/plain
• データソース種別:
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  • CiNii Articles