Effect of ion beam energy on the electrical, optical, and structural properties of indium tin oxide thin films prepared by direct metal ion beam deposition technique

• Daeil Kim

• Steven Kim

収録刊行物

• Thin Solid Films

  Thin Solid Films 408 (1-2), 218-222, 2002-04

  Elsevier BV

キーワード

• Materials Chemistry
• Metals and Alloys
• Surfaces, Coatings and Films
• Surfaces and Interfaces
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1360861292255331200
• NII論文ID: 30006196555
• DOI: 10.1016/s0040-6090(02)00148-7
• ISSN: 00406090
• Web Site: https://api.elsevier.com/content/article/PII:S0040609002001487?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:S0040609002001487?httpAccept=text/plain
• データソース種別:
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