Adsorbed layer and thin film growth modes monitored by Auger electron spectroscopy

• C. Argile

• G.E. Rhead

Journal

• Surface Science Reports

  Surface Science Reports 10 (6-7), 277-356, 1989-11

  Elsevier BV

Keywords

• Materials Chemistry
• Metals and Alloys
• Surfaces, Coatings and Films
• Surfaces and Interfaces
• Condensed Matter Physics
• Electronic, Optical and Magnetic Materials
• General Chemistry

Details

• CRID: 1362544419477945344
• NII Article ID: 30008438270
• DOI: 10.1016/0167-5729(89)90001-0
• ISSN: 01675729
• Web Site: https://api.elsevier.com/content/article/PII:0167572989900010?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:0167572989900010?httpAccept=text/plain
• Data Source:
  • Crossref
  • CiNii Articles