Tapping-mode atomic force microscopy on intact cells: optimal adjustment of tapping conditions by using the deflection signal

• Véronique Vié

• Marie-Cécile Giocondi

• Eric Lesniewska

• Eric Finot

• Jean-Pierre Goudonnet

• Christian Le Grimellec

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 82 (1-4), 279-288, 2000-02

  Elsevier BV

キーワード

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1360298761995307264
• NII論文ID: 30008697604
• DOI: 10.1016/s0304-3991(99)00137-0
• ISSN: 03043991
• Web Site: https://api.elsevier.com/content/article/PII:S0304399199001370?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:S0304399199001370?httpAccept=text/plain
• データソース種別:
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  • CiNii Articles