Convergent beam electron diffraction extinction distance measurements for quantitative analysis of Si1−xGex

• D. Delille

• R. Pantel

• G. Vincent

• E.Van Cappellen

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 93 (1), 1-9, 2002-10

  Elsevier BV

キーワード

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1360574093530794624
• NII論文ID: 30008698218
• DOI: 10.1016/s0304-3991(02)00124-9
• ISSN: 03043991
• ISSN: http://id.crossref.org/issn/03043991
• Web Site: https://api.elsevier.com/content/article/PII:S0304399102001249?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:S0304399102001249?httpAccept=text/plain
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