Breakdown of the weak-phase object approximation in amorphous objects and measurement of high-resolution electron optical parameters
収録刊行物
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- Ultramicroscopy
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Ultramicroscopy 56 (1-3), 26-31, 1994-11
Elsevier BV
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詳細情報
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- CRID
- 1362544421055553664
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- NII論文ID
- 30008698317
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- ISSN
- 03043991
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- データソース種別
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- Crossref
- CiNii Articles