On the mean inner potential in high- and low-energy electron diffraction

• D.K. Saldin

• J.C.H. Spence

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 55 (4), 397-406, 1994-10

  Elsevier BV

キーワード

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1360298344734149120
• NII論文ID: 30008698342
• DOI: 10.1016/0304-3991(94)90175-9
• ISSN: 03043991
• Web Site: https://api.elsevier.com/content/article/PII:0304399194901759?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:0304399194901759?httpAccept=text/plain
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