Detection limits in elemental distribution images produced by energy filtering TEM: case study of grain boundaries in Si3N4

• A. Berger

• J. Mayer

• H. Kohl

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 55 (1), 101-112, 1994-07

  Elsevier BV

キーワード

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1364233270566102272
• NII論文ID: 30008698389
• DOI: 10.1016/0304-3991(94)90084-1
• ISSN: 03043991
• Web Site: https://api.elsevier.com/content/article/PII:0304399194900841?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:0304399194900841?httpAccept=text/plain
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