Cross-correlation method for intensity measurement of transmission electron-diffraction patterns

• XU P.

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 53 15-, 1994

詳細情報

• CRID: 1573950400948587776
• NII論文ID: 30008698463
• DOI: 10.1016/0304-3991(94)90100-7
• データソース種別:
  • CiNii Articles