Towards automatic electron tomography II. Implementation of autofocus and low-dose procedures

• K. Dierksen

• D. Typke

• R. Hegerl

• W. Baumeister

Journal

• Ultramicroscopy

  Ultramicroscopy 49 (1-4), 109-120, 1993-02

  Elsevier BV

Keywords

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

Details

• CRID: 1364233268745005440
• NII Article ID: 30008698637
• DOI: 10.1016/0304-3991(93)90217-l
• ISSN: 03043991
• Web Site: https://api.elsevier.com/content/article/PII:030439919390217L?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:030439919390217L?httpAccept=text/plain
• Data Source:
  • Crossref
  • CiNii Articles