New methods for qualitative and quantitative analysis of the GaAs/AlGaAs interface by high-resolution electron microscopy

• THOMA S.

Journal

• Ultramicroscopy

  Ultramicroscopy 38 265-289, 1991

Details

• CRID: 1573668925971882880
• NII Article ID: 30008699266
• DOI: 10.1016/0304-3991(91)90161-x
• Data Source:
  • CiNii Articles