In-situ electron-beam-induced reduction of CuO: A study of phase transformations in cupric oxide

• Neil J. Long

• Amanda K. Petford-Long

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 20 (1-2), 151-159, 1986-01

  Elsevier BV

キーワード

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1361981470052282112
• NII論文ID: 30008700473
• DOI: 10.1016/0304-3991(86)90181-6
• ISSN: 03043991
• Web Site: https://api.elsevier.com/content/article/PII:0304399186901816?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:0304399186901816?httpAccept=text/plain
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