Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysis
収録刊行物
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- Ultramicroscopy
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Ultramicroscopy 94 (3-4), 309-327, 2003-04
Elsevier BV
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詳細情報
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- CRID
- 1360855569923236736
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- NII論文ID
- 30008701736
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- ISSN
- 03043991
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- データソース種別
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- Crossref
- CiNii Articles