Breaking the spherical and chromatic aberration barrier in transmission electron microscopy

• B. Freitag

• S. Kujawa

• P.M. Mul

• J. Ringnalda

• P.C. Tiemeijer

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 102 (3), 209-214, 2005-02

  Elsevier BV

キーワード

• Instrumentation
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1360580235272268672
• NII論文ID: 30008702575
• DOI: 10.1016/j.ultramic.2004.09.013
• ISSN: 03043991
• Web Site: https://api.elsevier.com/content/article/PII:S0304399104001834?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:S0304399104001834?httpAccept=text/plain
• データソース種別:
  • Crossref
  • CiNii Articles