Application of Ion Attachment Mass Spectrometry to Evolved Gas Analysis for in Situ Monitoring of Porous Ceramic Processing

• Takahisa Tsugoshi

  Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Technology (AIST) and Canon ANELVA Technix Corporation, 2266-98 Anagahora, Shimo-Shidami, Moriyama-ku, Nagoya 463-8560, Japan

• Takaaki Nagaoka

  Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Technology (AIST) and Canon ANELVA Technix Corporation, 2266-98 Anagahora, Shimo-Shidami, Moriyama-ku, Nagoya 463-8560, Japan

• Megumi Nakamura

  Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Technology (AIST) and Canon ANELVA Technix Corporation, 2266-98 Anagahora, Shimo-Shidami, Moriyama-ku, Nagoya 463-8560, Japan

• Yoshiro Shiokawa

  Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Technology (AIST) and Canon ANELVA Technix Corporation, 2266-98 Anagahora, Shimo-Shidami, Moriyama-ku, Nagoya 463-8560, Japan

• Koji Watari

  Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Technology (AIST) and Canon ANELVA Technix Corporation, 2266-98 Anagahora, Shimo-Shidami, Moriyama-ku, Nagoya 463-8560, Japan

Journal

• Analytical Chemistry

  Analytical Chemistry 78 (7), 2366-2369, 2006-02-24

  American Chemical Society (ACS)

Keywords

• Analytical Chemistry

Details

• CRID: 1362825894089509248
• NII Article ID: 30011391925
• DOI: 10.1021/ac0518248
• ISSN: 15206882
• ISSN: 00032700
• Web Site: https://pubs.acs.org/doi/pdf/10.1021/ac0518248
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