Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip

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Journal

J. Electronic Testing : Theory and Applications  

J. Electronic Testing : Theory and Applications 18, 213-230, 2002 

Cited by:  17

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Codes

  • NII Article ID (NAID) :
    30012616952
  • Article Type :
    Journal Article
  • Databases :
    CJPref 

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