Molecular structure and thickness of highly oriented poly(tetrafluoroethylene) films measured by atomic force microscopy

• P. Dietz

• P. K. Hansma

• K. J. Ihn

• F. Motamedi

• P. Smith

収録刊行物

• Journal of Materials Science

  Journal of Materials Science 28 (5), 1372-1376, 1993-03

  Springer Science and Business Media LLC

キーワード

• Mechanical Engineering
• Mechanics of Materials
• General Materials Science

詳細情報

• CRID: 1360016868660882560
• NII論文ID: 30012840702
• DOI: 10.1007/bf01191980
• ISSN: 15734803
• ISSN: 00222461
• Web Site: http://link.springer.com/content/pdf/10.1007/BF01191980.pdf
• Web Site: http://link.springer.com/article/10.1007/BF01191980/fulltext.html
• Web Site: http://link.springer.com/content/pdf/10.1007/BF01191980
• データソース種別:
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  • CiNii Articles