Near-field differential scanning optical microscope with atomic force regulation

DOI PDF 被引用文献16件
  • R. Toledo-Crow
    Center for Imaging Science, Rochester Institute of Technology, P.O. Box 9887, Rochester, New York 14623-0887
  • P. C. Yang
    Center for Imaging Science, Rochester Institute of Technology, P.O. Box 9887, Rochester, New York 14623-0887
  • Y. Chen
    Center for Imaging Science, Rochester Institute of Technology, P.O. Box 9887, Rochester, New York 14623-0887
  • M. Vaez-Iravani
    Center for Imaging Science, Rochester Institute of Technology, P.O. Box 9887, Rochester, New York 14623-0887

抄録

<jats:p>We present the design and describe the operation of a scanning probe microscope which simultaneously provides the attractive mode force and near-field optical images of objects. In this technique, the force signal is used to track the topography, thus allowing the optical signal primarily to show variations in transmissivity. A number of results are presented on the application of the technique to imaging different samples.</jats:p>

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