AN X-RAY INTERFEROMETER

• U. Bonse

  Department of Materials Science and Engineering, Cornell University, Ithaca, New York

• M. Hart

  Department of Materials Science and Engineering, Cornell University, Ithaca, New York

収録刊行物

• Applied Physics Letters

  Applied Physics Letters 6 (8), 155-156, 1965-04-15

  AIP Publishing

キーワード

• Physics and Astronomy (miscellaneous)

詳細情報

• CRID: 1361981469709047168
• NII論文ID: 30015813823
• DOI: 10.1063/1.1754212
• ISSN: 10773118
• ISSN: 00036951
• Web Site: https://pubs.aip.org/aip/apl/article-pdf/6/8/155/18417804/155_1_online.pdf
• データソース種別:
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  • CiNii Articles