Optical measurements of electronic bandstructure in AlGaInP alloys grown by gas source molecular beam epitaxy
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- Stephen P. Najda
- Sharp Laboratories of Europe, Ltd., Edmund Halley Road, Oxford Science Park, Oxford OX4 4GA, United Kingdom
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- Alistair H. Kean
- Sharp Laboratories of Europe, Ltd., Edmund Halley Road, Oxford Science Park, Oxford OX4 4GA, United Kingdom
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- Martin D. Dawson
- Sharp Laboratories of Europe, Ltd., Edmund Halley Road, Oxford Science Park, Oxford OX4 4GA, United Kingdom
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- Geoffrey Duggan
- Sharp Laboratories of Europe, Ltd., Edmund Halley Road, Oxford Science Park, Oxford OX4 4GA, United Kingdom
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<jats:p>A series of bulk (AlyGa1−y)0.52In0.48P epilayers, covering the full range of compositions from y=0 to y=1, have been grown lattice matched on GaAs substrates by gas source molecular beam epitaxy. Double crystal x-ray diffraction, and low temperature photoluminescence (PL) and photoluminescence excitation (PLE) optical spectroscopy have been used to characterize the structures. PL and PLE data indicate the direct-to-indirect energy gap crossover composition to be near y∼0.55 for this alloy system. From PLE, the y dependence of the (5 K) lowest energy direct gap, EΓ–Γ, has been found to be 2.014+0.499y+0.16y2 eV. EΓ–Γ (5 K) for the indirect-gap ternary end-member Al0.52In0.48P is directly determined to be 2.685 eV.</jats:p>
収録刊行物
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- Journal of Applied Physics
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Journal of Applied Physics 77 (7), 3412-3415, 1995-04-01
AIP Publishing
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詳細情報 詳細情報について
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- CRID
- 1360861291432382720
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- NII論文ID
- 30015852827
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- NII書誌ID
- AA00693547
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- DOI
- 10.1063/1.358631
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- ISSN
- 10897550
- 00218979
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