Preferred Orientation Determination Using a Geiger Counter X-Ray Diffraction Goniometer

• B. F. Decker

  General Electric Research Laboratory, Schenectady, New York

• E. T. Asp

  General Electric Research Laboratory, Schenectady, New York

• D. Harker

  General Electric Research Laboratory, Schenectady, New York

抄録

A simple and accurate method of determining pole figures by using a special sample mount with a Geiger counter x-ray diffraction goniometer is described and examples given. Also, a correction formula is derived which takes into account absorption change and change in diffracting volume as the sample changes position with respect to the x-ray beam.

収録刊行物

• Journal of Applied Physics

  Journal of Applied Physics 19 (4), 388-392, 1948-04-01

  AIP Publishing

キーワード

• General Physics and Astronomy

詳細情報

• CRID: 1360292618508505600
• NII論文ID: 30015899356
• NII書誌ID: AA00693547
• DOI: 10.1063/1.1715077
• ISSN: 10897550
• ISSN: 00218979
• Web Site: https://pubs.aip.org/aip/jap/article-pdf/19/4/388/7915994/388_1_online.pdf
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