Scanning nonlinear dielectric microscope

• Yasuo Cho

  Department of Electrical and Electronic Engineering, Faculty of Engineering, Yamaguchi University, 2557 Tokiwadai, Ube 755, Japan

• Akio Kirihara

  Department of Electrical and Electronic Engineering, Faculty of Engineering, Yamaguchi University, 2557 Tokiwadai, Ube 755, Japan

• Takahiro Saeki

  Department of Electrical and Electronic Engineering, Faculty of Engineering, Yamaguchi University, 2557 Tokiwadai, Ube 755, Japan

抄録

This article describes a new scanning technique for imaging the state of spontaneous polarization of a ferroelectric material by measuring the microscopic point-to-point variation of its nonlinear dielectric constants. First, the theory for detecting polarization is described. Second, the technique for measuring the nonlinear dielectric response is described. Finally, using this new microscope, area scans are obtained of the polarization of poled lead zirconate titanate ceramics, a lithium niobate single crystal, and of piezoelectric thin films of the copolymer of vinylidene fluoride and trifluoroethylene.

収録刊行物

• Review of Scientific Instruments

  Review of Scientific Instruments 67 (6), 2297-2303, 1996-06-01

  AIP Publishing

キーワード

• Instrumentation

詳細情報

• CRID: 1361137046471105024
• NII論文ID: 30015947859
• DOI: 10.1063/1.1146936
• ISSN: 10897623
• ISSN: http://id.crossref.org/issn/10897623
• ISSN: 00346748
• Web Site: https://pubs.aip.org/aip/rsi/article-pdf/67/6/2297/19292362/2297_1_online.pdf
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