Full polarization measurement of synchrotron radiation with use of soft x-ray multilayers

DOI PDF 被引用文献5件
  • Hiroaki Kimura
    Department of Synchrotron Radiation Science, The Graduate University for Advanced Studies, PF, KEK, 1-1 Oho, Tsukuba 305, Japan
  • Masaki Yamamoto
    Research Institute for Scientific Measurements, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980, Japan
  • Mihiro Yanagihara
    Research Institute for Scientific Measurements, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980, Japan
  • Takumi Maehara
    Research Institute for Scientific Measurements, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980, Japan
  • Takeshi Namioka
    Research Institute for Scientific Measurements, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980, Japan

抄録

<jats:p>Using two Ru/Si multilayers as a phase shifter and an analyzer, we have measured the state of polarization for 12.8-nm synchrotron radiation (SR) of the beam line 11A at the Photon Factory. It has been found that the state of polarization depends largely on the vertical inclination angle of the first mirror of the beam line. From the phase information, we have determined parameters of the polarization ellipse including handedness.</jats:p>

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