A Novel Nondestructive, Noncontacting Method of Measuring the Depth of Thin Slits and Cracks in Metals

• Ronald J. Hruby

  Ames Research Center, NASA, Moffett Field, California 94035

• Lester Feinstein

  Ames Research Center, NASA, Moffett Field, California 94035

抄録

A novel method of measuring the depth of ultrathin deep slots in metal surfaces is presented. This method is a noncontacting nondestructive application of microwave theory and practice involving the degeneration of higher cylindrical eigenmodes to the fundamental mode. Theoretical and experimental considerations show a proportionality between the detected signal and the length-depth product. This method complements other procedures for measuring the depth of slots and cracks and provides a new and unique technique for measurement of very thin slots and cracks.

収録刊行物

• Review of Scientific Instruments

  Review of Scientific Instruments 41 (5), 679-683, 1970-05-01

  AIP Publishing

キーワード

• Instrumentation

詳細情報

• CRID: 1363951796246332800
• NII論文ID: 30015965075
• NII書誌ID: AA00817730
• DOI: 10.1063/1.1684617
• ISSN: 10897623
• ISSN: 00346748
• Web Site: https://pubs.aip.org/aip/rsi/article-pdf/41/5/679/19231736/679_1_online.pdf
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