High‐Temperature‐Post‐Exposure Bake Process (HIT‐PEB) for Base‐Developable Polyimides Consisting of Diazonaphthoquinones and Polyamic Acids
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- Shuzi Hayase
- Chemical Laboratory, Toshiba Corporation, Komukai‐Toshiba‐cho, Saiwai‐ku, Kawasaki 210, Japan
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- Kei Takano
- Chemical Laboratory, Toshiba Corporation, Komukai‐Toshiba‐cho, Saiwai‐ku, Kawasaki 210, Japan
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- Yukihiro Mikogami
- Chemical Laboratory, Toshiba Corporation, Komukai‐Toshiba‐cho, Saiwai‐ku, Kawasaki 210, Japan
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- Yoshihiko Nakano
- Chemical Laboratory, Toshiba Corporation, Komukai‐Toshiba‐cho, Saiwai‐ku, Kawasaki 210, Japan
収録刊行物
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- Journal of The Electrochemical Society
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Journal of The Electrochemical Society 138 (12), 3625-3629, 1991-12-01
The Electrochemical Society
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キーワード
詳細情報 詳細情報について
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- CRID
- 1361418520354144128
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- NII論文ID
- 30016155332
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- ISSN
- 19457111
- 00134651
- http://id.crossref.org/issn/00134651
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- データソース種別
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- Crossref
- CiNii Articles