Measurements of potential barrier height of grain boundaries in polycrystalline silicon by Kelvin probe force microscopy

• S. Tsurekawa *

• K. Kido

• T. Watanabe

収録刊行物

• Philosophical Magazine Letters

  Philosophical Magazine Letters 85 (1), 41-49, 2005-01

  Informa UK Limited

キーワード

• Condensed Matter Physics

詳細情報

• CRID: 1361137045631677952
• NII論文ID: 30016501468
• DOI: 10.1080/09500830500153859
• ISSN: 13623036
• ISSN: 09500839
• Web Site: http://www.tandfonline.com/doi/pdf/10.1080/09500830500153859
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