Near-edge x-ray-absorption fine structure of crystalline silicon dioxides

• Isao Tanaka

• Jun Kawai

• Hirohiko Adachi

収録刊行物

• Physical Review B

  Physical Review B 52 (16), 11733-11739, 1995-10-15

  American Physical Society (APS)

詳細情報

• CRID: 1360011144991744256
• NII論文ID: 30018986191
• NII書誌ID: AA00362255
• DOI: 10.1103/physrevb.52.11733
• ISSN: 10953795
• ISSN: 01631829
• Web Site: http://link.aps.org/article/10.1103/PhysRevB.52.11733
• Web Site: http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.52.11733/fulltext
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