Accuracy and resolution limits of Kelvin probe force microscopy

• Ulrich Zerweck

• Christian Loppacher

• Tobias Otto

• Stefan Grafström

• Lukas M. Eng

Journal

• Physical Review B

  Physical Review B 71 (12), 1-, 2005-03-25

  American Physical Society (APS)

Keywords

• Condensed Matter Physics
• Electronic, Optical and Magnetic Materials

Details

• CRID: 1363107369902722304
• NII Article ID: 30019098508
• DOI: 10.1103/physrevb.71.125424
• ISSN: 1550235X
• ISSN: 10980121
• Web Site: http://link.aps.org/article/10.1103/PhysRevB.71.125424
• Web Site: http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.71.125424/fulltext
• Data Source:
  • Crossref
  • CiNii Articles