Development of a system to analyse the structure of a submicrometre-sized single crystal by synchrotron X-ray diffraction
収録刊行物
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- Journal of Applied Crystallography
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Journal of Applied Crystallography 24 (4), 340-348, 1991-08-01
International Union of Crystallography (IUCr)
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詳細情報 詳細情報について
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- CRID
- 1361418519271051136
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- NII論文ID
- 30019499120
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- ISSN
- 00218898
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- データソース種別
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- Crossref
- CiNii Articles