Prediction of defect onset conditions in heat cycling based on a thermoelastic wafer model

• K. Mokuya

• I. Matsuba

収録刊行物

• IEEE Transactions on Electron Devices

  IEEE Transactions on Electron Devices 36 (2), 319-327, 1989

  Institute of Electrical and Electronics Engineers (IEEE)

キーワード

• Electrical and Electronic Engineering
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1360855570148995968
• NII論文ID: 30019645362
• DOI: 10.1109/16.19932
• ISSN: 00189383
• Web Site: http://xplorestaging.ieee.org/ielx1/16/789/00019932.pdf?arnumber=19932
• データソース種別:
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  • CiNii Articles