Gentest: an automatic test-generation system for sequential circuits

• W.-T. Cheng

• T.J. Chakraborty

収録刊行物

• Computer

  Computer 22 (4), 43-49, 1989-04

  Institute of Electrical and Electronics Engineers (IEEE)

キーワード

• General Computer Science

詳細情報

• CRID: 1362825895289872896
• NII論文ID: 30019961150
• DOI: 10.1109/2.25381
• ISSN: 00189162
• Web Site: http://xplorestaging.ieee.org/ielx1/2/962/00025381.pdf?arnumber=25381
• データソース種別:
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  • CiNii Articles