Mutual compensation of mobility and threshold voltage temperature effects with applications in CMOS circuits

• I.M. Filanovsky

• A. Allam

収録刊行物

• IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications

  IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications 48 (7), 876-884, 2001-07

  Institute of Electrical and Electronics Engineers (IEEE)

キーワード

• Electrical and Electronic Engineering

詳細情報

• CRID: 1363107368921787520
• NII論文ID: 30020146474
• DOI: 10.1109/81.933328
• ISSN: 10577122
• Web Site: http://xplorestaging.ieee.org/ielx5/81/20194/00933328.pdf?arnumber=933328
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