Propagation Characteristics of Surface Acoustic Waves in KNbO<sub>3</sub>/SrTiO<sub>3</sub>/Si Layered Structures
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- Wu Mu–Shiang
- Department of Electrical Engineering, Tatung Institute of Technology, Taipei 104, Taiwan, Republic of China
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- Shih Wen–Ching
- Department of Electrical Engineering, Tatung Institute of Technology, Taipei 104, Taiwan, Republic of China
書誌事項
- タイトル別名
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- Propagation Characteristics of Surface Acoustic Waves in KNbO3/SrTiO3/Si Layered Structures.
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抄録
The propagation characteristics of surface acoustic waves (SAWs) in KNObO3/SrTiO3/Si structures were investigated theoretically. Phase velocities (v p) decrease when the hK value of the SrTiO3 buffer layer increases from 0.04 to 0.2 for a specified thickness of the KNbO3 film. The value of the coupling coefficient (K2) can be as high as 10%. A layered structure with the interdigital transducer (IDT) located on top of the KNbO3 film is a better choice for device fabrication if we select a coupling coefficient of 1% as a reference for comparison. The results could provide useful information for combining optical devices, semiconductor devices and SAW devices on the same Si substrate.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 36 (4A), 2192-2195, 1997
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390001206249942528
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- NII論文ID
- 30021824629
- 130004523623
- 210000040950
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- NII書誌ID
- AA10457675
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- ISSN
- 13474065
- 00214922
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- 本文言語コード
- en
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- データソース種別
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- JaLC
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- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可