Long Retention of Gain-Cell Dynamic Random Access Memory With Undoped Memory Node

• Katsuhiko Nishiguchi

• Akira Fujiwara

• Yukinori Ono

• Hiroshi Inokawa

• Yasuo Takahashi

収録刊行物

• IEEE Electron Device Letters

  IEEE Electron Device Letters 28 (1), 48-50, 2007-01

  Institute of Electrical and Electronics Engineers (IEEE)

キーワード

• Electrical and Electronic Engineering
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1361418521054482048
• NII論文ID: 30024525936
• DOI: 10.1109/led.2006.887625
• ISSN: 07413106
• Web Site: http://xplorestaging.ieee.org/ielx5/55/4039542/04039553.pdf?arnumber=4039553
• データソース種別:
  • Crossref
  • CiNii Articles